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Beilstein J. Nanotechnol. 2015, 6, 1116–1124, doi:10.3762/bjnano.6.113
Figure 1: Measured and reconstructed dI/dz data obtained from I(z) measurements using three sets of fit param...
Figure 2: Measured and reconstructed I(z) data. The reconstructed traces were based on the fit parameters fro...
Figure 3: Logarithmic conductance versus tip-sample distance for measured and reconstructed I(z) data. The re...
Figure 4: Measured and reconstructed dz/dV traces obtained from z(V) measurements by using three sets of fit ...
Figure 5: Logarithmic conductance versus tip-sample distance for measured and reconstructed z(V) data. The re...
Figure 6: Combined logarithmic conductance versus tip–sample distance for z(V) and I(z) measurements. Logarit...
Figure 7: Measured and reconstructed dI/dz data obtained from I(z) measurements for γ = 0.5. The masking effe...
Figure 8: Measured and reconstructed dz/dV traces obtained from z(V) measurements for γ=0.5. The masking effe...